Inspection Image Comparison
PIXEL's Integrated Inspection Technology — Connecting Optics, Inspection, Data, AI, and Verification
Explore how color imaging, specialized optics, AI inspection, CAD-based segmentation, and IVS/ICS technologies enhance defect assessment reliability and operational efficiency.
Inspection Image Comparison
Inspection Image Comparison
Color vs Mono
Inspection Image Comparison
Color vs UV
Inspection Image Comparison
Color vs Dent
Core Technology
Explore how our technologies address specific defect types and operational challenges.
Defect Detection Using Color and Texture Differences
Color imaging reveals differences in color and surface characteristics that are difficult to distinguish in monochrome images, improving defect identification and making visual review easier for operators.
UV, IR, and Dent Specialized Optical Technologies
Depending on the defect type, UV, IR, and specialized optics for dent inspection help detect defects that are difficult to identify under conventional illumination, including DFR residue, open/short defects beneath solder resist (SR), and dents.
AI Inspection That Complements Rule-Based Inspection
AI inspection targets irregular defects in critical areas that are difficult to detect using conventional rule-based inspection, helping reduce detection blind spots.
CAD-Based Segmentation and Inspection Parameter Setup
Using ODB++, Gerber, and Golden Board data, the system generates inspection regions and supports detailed segmentation and inspection parameter settings for areas such as Bump, Metal, SR, Pattern, and Via.
Defect Image-Based Review and Assessment
IVS uses defect images captured by AVI to classify and measure defects, review potential false positives, and support final OK/NG decisions.
Precision Verification with All-in-Focus Imaging
High-magnification All-in-Focus images generated from multiple focal planes, together with Pseudo 3D View, enable detailed re-examination of defects that are difficult to assess.
Centralized Recipe Management and Deployment Across Equipment
Using CAM data, NAS, and databases, Pixel Master centrally manages inspection recipes, supports deployment across inspection systems for the same product model and recipe reuse for similar models, and reduces equipment-specific tuning time.
Integrated Management of Inspection Data and Defect Information
Data Master centrally consolidates defect assessment results, inspection specification status, defect occurrence trends, and statistical data across inspection systems, helping users monitor inspection status and quality trends.
Inspection, Verification, and AI in the PIXEL Operating System
PIXEL's integrated architecture brings together inspection equipment, Verify, AI, and the recipe platform into a unified system.
Panel AVI
An automated optical inspection system for high-volume panel production, utilizing color imaging to detect defects.
- Detection of pattern defects, contamination, and solder resist (SR) defects
- Optional UV/IR optical configurations
Detection of pattern defects, contamination, and solder resist (SR) defectsStrip & Tray AFVI
An automated optical inspection system designed for final visual inspection of semiconductor packages in strip, unit, and tray formats.
- Strip magazine/stack and JEDEC tray handling
- 2D/3D inspection for dent and surface defects
IVS
An image-based verification system that uses defect images captured by AVI to review potential false positives, classify defects, and support inspection decisions.
- Defect map-based image review and assessment
- Non-contact verification using inspection images
ICS
A precision verification system that uses high-magnification All-in-Focus imaging and Pseudo 3D View to re-examine defects that are difficult to assess.
- x10 lens with 0.345 µm/pixel resolution
- Image capture time: 1.5 seconds per point
Pixel Master
A centralized management platform for CAM data, NAS storage, and inspection specifications, enabling efficient recipe deployment across multiple inspection systems and production lines.
- Centralized Inspection Recipe Management
- Recipe Deployment Across Multiple Inspection Systems and Production Lines
PIXEL AI Integration — Bringing AI to the Production Floor
AI Inspection That Addresses the Limitations of Rule-Based Inspection
PIXEL AI uses AVI/AFVI images and CAM data to inspect critical areas and detect irregular defects. It also learns overkill patterns to help reduce false positives and integrates with IVS/ICS workflows to support final inspection decisions.
From Data Preparation to Field Deployment
Process-specific color inspection images enable rapid AI model training and scalable deployment across production lines.
- Unified Data Management and Labeling Workflow
- Rapid Deployment to Production Lines After Model Validation
- Continuous Model Retraining Framework Based on Operational Data
Key AI Capabilities for Manufacturing Inspection
An AI system designed for manufacturing environments, supporting both defect inspection and inspection-result filtering.
- OK/NG Filtering and Critical Area Inspection
- Parallel Operation with Rule-Based Inspection
Enhance Defect Detection Performance and Operational Efficiency
PIXEL integrates rule-based inspection, AI inspection, and operator review to reduce the risk of defect escapes and minimize reliance on manual inspection.
- Minimized Risk of Defect Escapes
- Reduced Workload for Operator Review and Teaching
- Seamless Integration with IVS/ICS and Pixel Master
Customer Challenges and How PIXEL Addresses ThemCustomer Challenges and How PIXEL Addresses Them
PIXEL's integrated architecture connects inspection equipment, Verify, AI, and the recipe platform into a unified system.
Limitations in Detecting Color Differences with Monochrome Inspection
Depending on the defect type, color imaging and multi-wavelength optical options provide operators and AI systems with additional visual information for defect identification.
Heavy Workload from Overkill Reviews and Verify Operations
By integrating IVS, AI filtering, and ICS into a step-by-step workflow, PIXEL enables precise inspection reviews while minimizing the risk of defect escapes.
Heavy Workload from Repeated Recipe Creation During Deployment and Product Model Changes
Pixel Master enables centralized recipe management, accelerating recipe deployment across multiple inspection systems for the same product model and significantly reducing machine-specific recipe tuning time.
Blind Spots in Defect Detection
AI Inspection for Critical Areas Enhances the Detection of Defects That Are Difficult to Identify Using Rule-Based Inspection Alone.
Visual Inspection Processes That Are Difficult to Automate
Even defects that typically rely on manual visual inspection—such as dent defects—can be detected using PIXEL's specialized optical technology.
Tell us which defects are hardest in your process and we'll recommend the right technology mix.Challenging Defects? PIXEL Has the Inspection Solution.
We combine optical, AI, and verification technologies to deliver inspection solutions tailored to your processes and requirements.