Comparison
PIXEL's integrated inspection technology connecting optics, inspection, data, AI, and verify
See how color imaging, special optics, AI inspection, CAD segmentation, and IVS / ICS improve judgment quality and operational efficiency.
Comparison
Comparison
Color vs Mono
Comparison
Color vs UV
Comparison
Color vs Dent
Core Technology
Explore how each technology addresses specific defect types and operational challenges.
Color images that capture more defect information
Compared to mono images, color reveals richer differences in hue and texture, improving defect discrimination and operator readability.
UV, IR, Dent optics
Detects defects difficult with standard illumination alone—such as DFR residue, Open/Short beneath SR, and dent defects.
AI inspection
Inspects critical areas that rule-based inspection alone cannot cover.
CAD-based region segmentation and data management
Generates inspection regions from ODB++, Gerber, and Golden Board data, classifies Bump / Metal / SR / Pattern / Via regions, and enables detailed segmentation and inspection settings per region.
Image-based verify
Uses AVI defect images directly for classification, measurement, overkill reduction, and final OK / NG judgment.
All-in-Focus precision verify
High-magnification multi-layer image capture enables precise re-check of only hard-to-judge defects and provides 3D view.
Central recipe management
CAM / NAS / DB-based central management speeds rollout across machines of the same model and reuse of similar models, reducing per-equipment recipe tuning time.
Integrated defect information management
Centrally manages defect judgments, spec status, defect trends, and statistics across all inspection equipment.
Inspection, verify, and AI in the PIXEL operating system
PIXEL's architecture unifies inspection equipment, verify, AI, and recipe platforms in one system.
Panel AVI
Main panel mass-production inspection platform performing color image-based defect detection.
- Pattern, contamination, SR-related defect detection
- UV and IR option available
Pattern, contamination, SR-related defect detectionStrip & Tray AFVI
Product line optimized for strip, unit, and tray-based package appearance inspection.
- Strip magazine + stack and JEDEC tray operation
- 2D / 3D AFVI, dent and surface defect coverage
IVS
Uses AVI defect images directly for overkill reduction and defect classification.
- Defect map based review
- Remote and touchless verification
ICS
Re-confirms only hard-to-judge defects with high-magnification All-in-Focus imaging and Pseudo 3D View.
- x10 lens, 0.345 um/pixel
- 1.5 sec per point capture
Pixel Master
Centrally manages CAM / NAS / spec database to speed model rollout and cross-equipment deployment.
- Central recipe management
- Multi-line deployment support
PIXEL AI Integration from deployment to the field
AI inspection that complements rule-based gaps
Critical areas and irregular defects are inspected using AVI / AFVI images and CAM data; overkill patterns are learned and linked to IVS / ICS workflows for final judgment.
From data preparation to field deployment
Process-specific color inspection images enable fast training and horizontal rollout.
- Unified data management and labeling workflow
- Immediate line deployment after model validation
- Retraining structure based on operational data
Key AI capabilities for manufacturing inspection
An AI system usable in the field for both inspection and filtering.
- OK/NG filtering / critical area inspection
- Operates in parallel with rule-based inspection
Improve detection performance and operational efficiency together
Links rule-based inspection, AI inspection, and operators to suppress NG escape risk and reduce operator dependency.
- Zero NG escape
- Reduced operator review and teaching burden
- Integrated operation with IVS / ICS / Pixel Master
Customer pain points and how we address themCustomer pain points and how we address them
PIXEL's architecture unifies inspection equipment, verify, AI, and recipe platforms in one system.
Color differences are hard to read with mono-based inspection
Color images and multi-wavelength optical options provide more defect cues for both operators and AI, depending on defect type.
High overkill handling and verify burden
Combines IVS, AI filtering, and ICS in stages to achieve precise review without NG defect escape.
Heavy recipe authoring burden at rollout and model change
Central management through Pixel Master speeds rollout across machines of the same model and dramatically reduces per-equipment recipe tuning time.
Blind spots in inspection coverage
AI inspection for critical areas detects defects that rule-based inspection alone cannot catch.
Visual inspection that cannot be automated
Defects with high visual dependency—such as dent defects—can be detected with PIXEL specialty optics.
Tell us which defects are hardest in your process and we'll recommend the right technology mix.Tell us which defects are hardest in your process and we'll recommend the right technology mix.
We can review which of Color, UV, IR, Dent, AI, IVS, or ICS fits your process conditions.